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Grade 1 Clean Manufacturing Solutions, Control Micro-Contamination, Improve Yield

Funa Cleanliness is committed to providing manufacturing enterprises with a complete contamination control system covering environment, equipment, materials, and processes.

SOLUTION

Contamination Challenges in Semiconductor Manufacturing

Cleanroom Environment Particles

  • Settling particles
  • AMHS transport contamination
  • Personnel activity contamination
  • Equipment operation contamination
Cleanroom Environment Particles

Wafer Surface Contamination

  • Metallic particles
  • Non-metallic particles
  • Organic contaminants
  • Thin film residues
Wafer Surface Contamination

Equipment & Process Contamination

  • Chamber shedding
  • Pipeline particles
  • Process residues
  • Material outgassing
Equipment & Process Contamination

Consumable-Introduced Contamination

  • Cleanroom wipes
  • Gloves
  • Packaging materials
  • Chemicals
Consumable-Introduced Contamination

SOLUTION

Semiconductor Contamination Control Process

1

Environmental Monitoring

Cleanroom Particle Monitoring

Fastmicro
2

Particle Discovery

Particle Counting and Classification

Fastmicro
3

Particle analysis

Morphology and composition analysis

ParticleX / Phenom
4

Pollution source tracing

Pinpointing pollution sources

Coredux
5

Verification of Corrective Actions

Cleaning and Consumables Control

Texwipe
6

Continuous monitoring

Data Trends and Early Warnings

Fastmicro

SOLUTION

Solutions

Verification of Equipment Component Cleanliness After Cleaning

Using the PMC 2.0 particle measurement card, the Fastmicro Sample Scanner transforms the assessment of particle contamination on equipment components from a subjective "clean or not" judgment into quantifiable, verifiable data. The PMC enables surface sampling across flat and curved surfaces, cavities, rough textures, and hard-to-reach areas. Once the sample is processed by the scanner, it rapidly generates results—including particle count, size, and distribution—making it ideal for post-cleaning verification, pre-assembly release, incoming material inspection, supplier cleanliness benchmarking, and surface cleanliness validation in accordance with ISO 14644-9 and SEMI E195 standards.

Recommended Product Portfolio

Fastmicro Sample Scanner / PMC 2.0 Particle Measurement Card / Clean Transfer Box.

Typical output

Particle count, size, distribution, and inspection reports, as well as comparative results—before and after cleaning, between batches, and across suppliers.

Testing capabilities

Detects particles down to 0.5 μm (PSL-equivalent); 225 mm² sampling area; supports 90% collection efficiency, >90% repeatability, and KLARF/CSV output.

Application value

Incorporate particle inspection on the surfaces of complex components into a quantifiable and verifiable cleanliness validation process to reduce discrepancies arising from manual assessment.

Applicable Scope

Critical components of semiconductor equipment, post-cleaning assemblies, chamber parts, assembled units, and incoming supplier materials; covers scenarios including equipment, assemblies, components, and cleaning processes.

Sampling Advantages

PMC sampling is suitable for complex surfaces that are difficult to scan directly and minimizes interference with the body of high-value, precision components.

User Teams

Quality teams, cleaning engineers, assembly teams, and supply chain quality and application engineers.

Usage Stages

Post-cleaning verification, pre-assembly release, incoming material re-inspection, anomaly review, and supplier cleanliness comparison.


Customer Case

Customer Cases

ASML

ASML

Dr. Ir. L.H.A. Leunissen | ASML, Cleanliness Project Manager, stated: "As a long-term partner, Fastmicro's integrated applications have helped us meet equipment defect rate targets. The equipment is not only precise in measurement, but also easy to operate with high throughput. We highly recognize Fastmicro's professional services and look forward to further expanding equipment capabilities through deep collaboration in the future."

SERVICE

Services

The ParticleX system offers highly flexible customization services, ensuring that analysis processes, classification rules, and data reports can precisely match your specific requirements. At its core is a highly open software platform that allows you to tailor the system to your specific processes and application scenarios.

Custom Identification & Classification Rules

Custom Identification & Classification Rules

This is the core of system customization, allowing adjustment or creation of new analysis workflows based on requirements without relying on factory presets.

Custom Data Reports & Visualization

Custom Data Reports & Visualization

The system automatically converts complex data into clear, intuitive reports, with both content and format customizable.

One-Click Standardized Report Generation

One-Click Standardized Report Generation

The system deeply integrates industry standards, enabling one-click generation of standardized authoritative reports.

Personalized User Interface & Workflow

Personalized User Interface & Workflow

The system can be locked in fully automatic mode for daily quality inspection, or switched to manual electron microscopy mode for failure analysis, achieving multi-purpose use from a single machine.

STRATEGIC SUPPLIER

Strategic Suppliers

Empowering Extreme Manufacturing

Founded in Eindhoven, the Netherlands, in 2019, Fastmicro is an innovative company specializing in surface particle measurement technology. Dedicated to driving breakthroughs in contamination control through rapid, precise, and quantitative detection, the company has grown into a leading global provider of cleanliness management solutions, with products deployed across seven countries and utilized throughout the high-tech supply chain. By deeply understanding customer needs, Fastmicro continuously optimizes system performance, helping high-tech sectors—such as semiconductor manufacturing and precision engineering—meet rigorous cleanliness standards and elevating the overall quality of the industry value chain.

RESOURCE CENTER

Resource Center

Whitepaper / Download

Semiconductor Industry Comprehensive Solutions

Whitepaper / Download

Cleanliness Control Micro-Scale Surface Particle Detection

Contact Our Experts for a Tailored Solution

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