Raw Material Contaminant Detection
- Metallic impurities in cathode materials
- Contaminant particles in anode materials
- Contamination introduced during powder processing
- Contamination during raw material transport and storage
Funa Cleanliness leverages SEM+EDS intelligent analysis technology to provide full-process particle detection and contamination tracing solutions spanning raw materials, production processes, and failure analysis, helping lithium battery enterprises reduce contaminant risks and improve product consistency and reliability.
SOLUTION
SOLUTION
Problems with traditional industry methods:
· Manual pretreatment processes are cumbersome, time-consuming, and labor-intensive;
· Magnetic contaminant extraction is insufficient, weakly magnetic and small particles are easily missed;
· Results are affected by human factors, with scattered data and poor reproducibility;
· High safety risks, ICP digestion steps require strong acids.
Our solution:
Fully automated disaggregation → precision magnetic capture → cleaning & separation → safe digestion / filtration, closed system, no high-temperature strong acids, one-click completion, simultaneously producing ICP digestion solution and SEM filter membrane samples.

CORE PRODUCT
Customer Case
APPLICATION CASE
SERVICE
The ParticleX system offers highly flexible customization services, ensuring that analysis processes, classification rules, and data reports can precisely match your specific requirements. At its core is a highly open software platform that allows you to tailor the system to your specific processes and application scenarios.
This is the core of system customization, allowing adjustment or creation of new analysis workflows based on requirements without relying on factory presets.
The system automatically converts complex data into clear, intuitive reports, with both content and format customizable.
The system deeply integrates industry standards, enabling one-click generation of standardized authoritative reports.
The system can be locked in fully automatic mode for daily quality inspection, or switched to manual electron microscopy mode for failure analysis, achieving multi-purpose use from a single machine.
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