We provide standardized cleanliness testing services to address particle contamination issues affecting components, materials, and production processes. Our services support the analysis of particle count, size, morphology, and distribution, helping clients establish quality control systems that meet industry standards. We cater to application sectors such as automotive, lithium-ion batteries, and precision manufacturing.
Scanning Electron Microscopy (SEM) and Energy Dispersive Spectroscopy (EDS) are employed to identify the composition and analyze the elemental makeup of metallic particles, non-metallic particles, and unknown foreign objects, thereby enabling source identification and risk assessment. SEM-EDS is widely used in foreign object investigations, failure analysis, and quality improvement.
By integrating particle morphology, elemental composition, and process context, we conduct systematic analyses of contamination sources, anomalous particles, material failures, and production irregularities; this helps clients rapidly identify root causes and provides a basis for process optimization and quality improvement.
For wafer fabrication, packaging and testing, and high-purity manufacturing environments, we provide services for particle contamination analysis, surface contamination detection, and contamination source investigation. Supporting particle analysis ranging from the micrometer to the nanometer scale, we help customers improve yield and process stability.
Serving the iron, steel, and specialty steel industries, we provide services for the automated detection, classification, and compositional analysis of non-metallic inclusions, helping clients assess material purity, optimize smelting and manufacturing processes, and enhance product performance and reliability.
For clients dealing with unique samples, specialized processes, or complex failure issues, Funa Technology offers customized testing solutions, including:
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