Based on "adhesive tape lift" sampling technology, the SAS enables flexible sampling on various surfaces (including hard-to-reach areas and high-roughness surfaces) without leaving detectable residues. It identifies and counts particle contaminants as small as 0.5 µm within seconds. Combined with SEM+EDX, it precisely analyzes particle micro-morphology and composition, helping customers achieve a leap from air-only monitoring to surface cleanliness monitoring, providing scientific evidence for process optimization and continuous cleanliness improvement.